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MN54ABT244-x の電気的特性と機能

MN54ABT244-xのメーカーはNational Semiconductorです、この部品の機能は「REV 0B0」です。


製品の詳細 ( Datasheet PDF )

部品番号 MN54ABT244-x
部品説明 REV 0B0
メーカ National Semiconductor
ロゴ National Semiconductor ロゴ 




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MN54ABT244-x Datasheet, MN54ABT244-x PDF,ピン配置, 機能
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MN54ABT244-X REV 0B0
MICROCIRCUIT DATA SHEET
Original Creation Date: 09/02/94
Last Update Date: 09/24/98
Last Major Revision Date: 03/19/97
OCTAL BUFFER AND LINE DRIVER WITH TRI-STATE OUTPUTS
General Description
The ABT244 is an octal buffer and line driver with TRI-STATE outputs designed to be
employed as a memory and address driver, clock driver or bus-oriented
transmitter/receiver.
Industry Part Number
54ABT244
Prime Die
NB244
Controlling Document
See Features Page
NS Part Numbers
54ABT244E-QML *
54ABT244E-QMLV**
54ABT244J-QML ***
54ABT244J-QMLV****
54ABT244W-QML *****
54ABT244W-QMLV******
Processing
MIL-STD-883, Method 5004
Quality Conformance Inspection
MIL-STD-883, Method 5005
Subgrp Description
1 Static tests at
2 Static tests at
3 Static tests at
4 Dynamic tests at
5 Dynamic tests at
6 Dynamic tests at
7 Functional tests at
8A Functional tests at
8B Functional tests at
9 Switching tests at
10 Switching tests at
11 Switching tests at
Temp ( oC)
+25
+125
-55
+25
+125
-55
+25
+125
-55
+25
+125
-55
1

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MN54ABT244-x pdf, ピン配列
MN54ABT244-X REV 0B0
MICROCIRCUIT DATA SHEET
(Absolute Maximum Ratings)
(Note 1)
Vcc Pin Potential to Ground Potential
Input Voltage
(Note 2)
Input Current
(Note 2)
Voltage Applies To Any Output
In the Disabled or Power-Off State
In The High State
Current Applies To Output
In The Low State (Max)
Junction Temperature (Tj)
Ceramic
Thermal Resistance
Junction-to-Case (Theta JC)
Storage Temperature
Lead Temperature
(Soldering, 10 seconds)
ESD Classification
Maximum Power Dissipation
-0.5V to +7.0V
-0.5V to +7.0V
-30mA to +5.0mA
-0.5V to 5.5V
-0.5V to Vcc
96mA
+175C
See Mil-Std 1835
-65C to +150C
+300C
Class 1
500 mW
Note 1:
Note 2:
Absolute maximum ratings are values beyond which the device may be damaged or have
its useful life impaired. Functional operation under these conditions is not
implied.
Either voltage limit or current limit is sufficient to protect inputs.
Recommended Operating Conditions
Supply Voltage (Vcc)
Operating Temperature
Minimum Input Edge Rate (dV/dt)
Data Input
Enable Input
Maximum Output Current
High Level (Ioh)
Low Level (Iol)
4.5V to 5.5V
-55C to +125C
50 mV/ns
20 mV/ns
-24 mA
48 mA
3


3Pages


MN54ABT244-x 電子部品, 半導体
MN54ABT244-X REV 0B0
MICROCIRCUIT DATA SHEET
Electrical Characteristics
AC PARAMETERS
(The following conditions apply to all the following parameters, unless otherwise specified.)
AC: CL=50pF RL=500 OHMS TRISE/TFALL = 3.0nS
SYMBOL
tpLH
PARAMETER
CONDITIONS
Propagation Delay VCC=5.0V @25C, VCC=4.5V & 5.5V
@-55C/125C
NOTES
PIN-
NAME
2, 5 In to
On
MIN
1.0
MAX
4.1
UNIT
ns
SUB-
GROUPS
9
2, 5 In to 1.0 5.3 ns 10, 11
On
tpHL
Propagation Delay VCC=5.0V @25C, VCC=4.5V & 5.5V
@-55C/125C
2, 5 In to 1.0 4.2 ns 9
On
2, 5 In to 1.0 5.0 ns 10, 11
On
tpZL
Output Enable
Time
VCC=5.0V @25C, VCC=4.5V & 5.5V
@-55C/125C
2, 5 OE to 2.1 5.6 ns 9
On
2, 5 OE to 1.2 7.9 ns 10, 11
On
tpZH
Output Enable
Time
VCC=5.0V @25C, VCC=4.5V & 5.5V
@-55C/125C
2, 5 OE to 1.1 5.5 ns 9
On
2, 5 OE to 0.8 6.5 ns 10, 11
On
tpHZ
Output Disable
Time
VCC=5.0V @25C, VCC=4.5V & 5.5V
@-55C/125C
2, 5 OE to 2.1 5.6 ns 9
On
2, 5 OE to 1.2 7.6 ns 10, 11
On
tpLZ
Output Disable
Time
VCC=5.0V @25C, VCC=4.5V & 5.5V
@-55C/125C
2, 5 OE to 1.5 5.6 ns 9
On
2, 5 OE to 1.0 7.9 ns 10, 11
On
Note 1: SCREEN TESTED 100% ON EACH DEVICE AT -55C, +125C & +25C TEMP., SUBGROUPS 1,2,3,7 & 8.
Note 2:
Note 3:
Note 4:
Note 5:
Note 6:
SCREEN TESTED 100% ON EACH DEVICE AT -55C, +25C & +125C TEMP., SUBGROUPS A9, A10 &
A11.
SCREEN TESTED 100% ON EACH DEVICE AT +25C TEMP. ONLY, SUBGROUP 9.
SAMPLE TESTED (METHOD 5005, TABLE 1) ON EACH MFG. LOT AT +25C, +125C & -55C TEMP.,
SUBGROUPS A1, 2, 3, 7 & 8.
SAMPLE TESTED (METHOD 5005, TABLE 1) ON EACH MFG. LOT AT +25C, +125C & -55C TEMP.,
SUBGROUPS A9, 10, & 11.
SAMPLE TESTED (METHOD 5005, TABLE 1) ON EACH MFG. LOT AT +25C TEMP ONLY, SUBGROUP A9.
Note 7: NOT TESTED (GUARANTEED BY DESIGN CHARACTERIZATION DATA).
Note 8: MAX NUMBER OF OUTPUTS DEFINED AS (N). N-1 DATA INPUTS ARE DRIVEN 0V TO 3.0V. ONE
OUTPUT @ VOL OR @ VOH.
Note 9: MAX NUMBER OF DATA INPUTS (N) SWITCHING. (N-1) INPUTS SWITCHING 0V TO 3.0V.
INPUT-UNDERTEST SWITCHING: 3V TO THRESHOLD (VILD), 0V TO THRESHOLD (VIHD), FREQ.= 1
MHZ.
Note 10: MAXIMUM TEST DURATION NOT TO EXCEED ONE SECOND, NOT MORE THAN ONE OUTPUT SHORTED AT
ONE TIME.
6

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部品番号部品説明メーカ
MN54ABT244-x

REV 0B0

National Semiconductor
National Semiconductor


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