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LC717A10PJ の電気的特性と機能

LC717A10PJのメーカーはON Semiconductorです、この部品の機能は「Capacitance-Digital-Converter LSI」です。


製品の詳細 ( Datasheet PDF )

部品番号 LC717A10PJ
部品説明 Capacitance-Digital-Converter LSI
メーカ ON Semiconductor
ロゴ ON Semiconductor ロゴ 




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LC717A10PJ Datasheet, LC717A10PJ PDF,ピン配置, 機能
Ordering number : EN*A2214
LC717A10PJ
Advance Information
CMOS LSI
Capacitance-Digital-Converter LSI
for Electrostatic Capacitive Touch
Sensors
http://onsemi.com
Overview
The LC717A10PJ is a high-performance and low-cost capacitance-digital-converter LSI for electrostatic
capacitive touch sensor, especially focused on usability.
It has 16 channels capacitance-sensor input. This makes it ideal for use in the products that need many switches.
Since the calibration function and the judgment of ON/OFF are automatically performed in LSI internal, it can
make development time more short. A detection result (ON/OFF) for each input can be read out by the serial
interface (I2C compatible bus or SPI).
Also, measurement value of each input can be read out as 8-bit digital data. Moreover, gain and other parameters
can be adjusted using serial interface.
Function
Detection system: Differential capacitance detection (Mutual capacitance type)
Input capacitance resolution: Can detect capacitance changes in the femto Farad order
Measurement interval (16 differential inputs): 30ms (Typ) (at initial configuration),
6ms (Typ) (at minimum interval configuration)
External components for measurement: Not required
Interface: I2C * compatible bus or SPI selectable.
Current consumption: 570A (Typ) (VDD = 2.8V), 1.3mA (Typ) (VDD = 5.5V)
Supply voltage: 2.6V to 5.5V
Detection operations: Switch
Packages: SSOP30
* I2C Bus is a trademark of Philips Corporation.
This document contains information on a new product. Specifications and information
herein are subject to change without notice.
ORDERING INFORMATION
See detailed ordering and shipping information on page 14 of this data sheet.
Semiconductor Components Industries, LLC, 2014
May, 2014
SSOP30(225mil)
53014HK No.A2214-1/14

1 Page





LC717A10PJ pdf, ピン配列
LC717A10PJ
Continued from the previous page.
Parameter
Symbol
Conditions
Pin input voltage
VIH High input
VIL Low input
Pin output voltage
SDA pin output voltage
Pin leak current
VOH
VOL
VOH
VOL
VOL I2C
ILEAK
High output
(IOH = +3mA)
Low output
(IOL = -3mA)
VDD = 5V ±3%, High output
(IOH = +3mA)
VDD = 5V ±3%, Low output
(IOL = -3mA)
SDA Low output
(IOL = -3mA)
Current consumption
IDD
When initial setting and
non-touch
VDD = 2.8V
When initial setting and
non-touch
VDD = 5.5V
Short interval mode ( short
interval time is set to 5ms)
ISTBY
VDD = 5.5V
During Sleep process
*1) Design guarantee values (not tested before shipment)
*2) Measurements conducted using the test mode in the LSI
*3) Ta = +25C
*4) Apply to nRST, SCL, SDA, SA0, SA1, SCK, SI, nCS
*5) Apply to Cdrv, SO, INTOUT
*6) Apply to nRST, SCL, SDA, SA0, SA1, SCK, SI, nCS
min
0.8VDD
0.8VDD
0.96VDD
typ max Unit
0.2VDD
V
0.2VDD
V
0.02VDD
0.4
±1
570 980
V
V
A
A
1.3 2.2 mA
4.2 6.5 mA
0.1 70 A
Remarks
*4
*5
*1 *5
*6
*1
*1
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product performance may not be
indicated by the Electrical Characteristics if operated under different conditions.
No.A2214-3/14


3Pages


LC717A10PJ 電子部品, 半導体
LC717A10PJ
Dynamic offset calibration function to correct Cin offset drift
When measurement data at a certain channel are consecutively within the execution range of dynamic offset
calibration (4 to touch threshold, or -128 to -4) for the period of time corresponding to a value, dynamic offset
calibration is performed and the reference value at the channel is gradually corrected to 0.
The figure below shows the operation when the measured value began to drift in the positive
direction from the central value gradually.
The examples of setting to 8 times the dynamic offset calibration carried count.
Judgment points (They means measurement points where the LC717A10
judges whether to perform dynamic offset calibration
Judgment points within the execution range of dynamic offset calibration
All other measurement points other than the above
CinX Threshold
Execution Range of
Dynamic Offset Calibration
(Positive range)
4
0
Measurement Timing
Dynamic Offset Calibration
Execution Count Number 0 0 1 2
(Positive range)
Measurement Time + Long Interval Time [ms]
3
4567
Dynamic OffCal
Count Plus Register
= 0x01
Dynamic Offset
Calibration
t
80
No.A2214-6/14

6 Page



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部品番号部品説明メーカ
LC717A10PJ

Capacitance-Digital-Converter LSI

ON Semiconductor
ON Semiconductor


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