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Número de pieza | NDB5060L | |
Descripción | N-Channel Logic Level Enhancement Mode Field Effect Transistor | |
Fabricantes | Fairchild | |
Logotipo | ||
Hay una vista previa y un enlace de descarga de NDB5060L (archivo pdf) en la parte inferior de esta página. Total 12 Páginas | ||
No Preview Available ! October 1996
NDP5060L / NDB5060L
N-Channel Logic Level Enhancement Mode Field Effect Transistor
General Description
These logic level N-Channel enhancement mode power
field effect transistors are produced using Fairchild's
proprietary, high cell density, DMOS technology. This
very high density process has been especially tailored
to minimize on-state resistance, provide superior
switching performance, and withstand high energy
pulses in the avalanche and commutation modes.
These devices are particularly suited for low voltage
applications such as automotive, DC/DC converters,
PWM motor controls, and other battery powered
circuits where fast switching, low in-line power loss,
and resistance to transients are needed.
Features
26
A,
60
V.
RRDDSS(O(ONN) )==00.0.053Ω5 Ω@@VGVSG=S=5
V
10
V.
Critical DC electrical parameters specified at elevated
temperature.
Rugged internal source-drain diode can eliminate the need
for an external Zener diode transient suppressor.
175°C maximum junction temperature rating.
High density cell design for extremely low RDS(ON).
TO-220 and TO-263 (D2PAK) package for both through hole
and surface mount applications.
________________________________________________________________________________
D
G
Absolute Maximum Ratings
Symbol Parameter
TC = 25°C unless otherwise noted
NDP5060L
VDSS Drain-Source Voltage
VDGR
Drain-Gate Voltage (RGS < 1 MΩ)
VGSS Gate-Source Voltage - Continuous
- Nonrepetitive (tP < 50 µs)
ID Drain Current - Continuous
- Pulsed
PD Total Power Dissipation @ TC = 25°C
Derate above 25°C
TJ,TSTG Operating and Storage Temperature Range
S
60
60
±16
±25
26
78
68
0.45
-65 to 175
NDB5060L
Units
V
V
V
A
W
W/°C
°C
© 1997 Fairchild Semiconductor Corporation
NDP5060L Rev.A
1 page Typical Electrical Characteristics (continued)
1.15
I D = 250µA
1.1
1.05
1
0.95
0.9
-50
-25
0 25 50 75 100 125 150 175
T J , JUNCTION TEMPERATURE (°C)
Figure 7. Breakdown Voltage Variation with
Temperature.
20
10
5
V GS = 0V
1 TJ= 125°C
0.1
0.01
0.001
25°C
-55°C
0.0001
0
0.2 0.4 0.6 0.8
1
VSD , BODY DIODE FORWARD VOLTAGE (V)
1.2
Figure 8. Body Diode Forward Voltage
Variation with Current and Temperature.
1500
1000
500
Ciss
200
100
50
1
Coss
f = 1 MHz
VGS = 0V
Crss
23
5
10 20
VDS , DRAIN TO SOURCE VOLTAGE (V)
30
Figure 9. Capacitance Characteristics.
50
10
I D = 26A
8
VDS = 12V
24V
48V
6
4
2
0
0 10 20 30 40
Q g , GATE CHARGE (nC)
Figure 10. Gate Charge Characteristics.
VIN
VGEN
RGEN
G
RGS
VDD
RL
D
VOUT
DUT
S
Figure 11. Switching Test Circuit.
t d(on)
ton
tr
90%
td(off)
toff
tf
90%
VO U T
VIN
10%
10%
50%
10%
90%
INVERTED
50%
PULSE WIDTH
Figure 12. Switching Waveforms.
NDP5060L Rev.A
5 Page TO-263AB/D2PAK Tape and Reel Data and Package Dimensions, continued
TO-263AB/D2PAK (FS PKG Code 45)
1:1
Scale 1:1 on letter size paper
Dimensions shown below are in:
inches [millimeters]
Part Weight per unit (gram): 1.4378
August 1998, Rev. A
11 Page |
Páginas | Total 12 Páginas | |
PDF Descargar | [ Datasheet NDB5060L.PDF ] |
Número de pieza | Descripción | Fabricantes |
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NDB5060L | N-Channel Logic Level Enhancement Mode Field Effect Transistor | Fairchild |
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