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VV5430 の電気的特性と機能

VV5430のメーカーはETCです、この部品の機能は「Integrated CMOS Image Sensor with support for ADC and external control via serial interface」です。


製品の詳細 ( Datasheet PDF )

部品番号 VV5430
部品説明 Integrated CMOS Image Sensor with support for ADC and external control via serial interface
メーカ ETC
ロゴ ETC ロゴ 




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VV5430 Datasheet, VV5430 PDF,ピン配置, 機能
VISION VV 5430 Monolithic Sensor
Integrated CMOS Image Sensor with support
for ADC and external control via serial interface
PRODUCT DATASHEET
DISTINCTIVE CHARACTERISTICS
• Complete Video Camera on a single chip
• Automatic Exposure and Gain Control
• EIA/CCIR standard compatible
• Automatic Black Level Calibration
• Low power operation (250mW Typical)
• Linear or Gamma corrected output option
• Integral 75driver
• Control options pin selectable for ease of use
• Frame & line timing signals for external ADC
• External control/configuration via serial interface
• Optional image output in four quarters, with out- • Industry standard 48 pin LCC package
put driver tristate option for multiplexing
GENERAL DESCRIPTION
The VV5430 is a highly-integrated VLSI
camera device based on VISION’s unique
CMOS sensor technology. It is suitable for
applications requiring minimum external
circuitry, digitisation of the video signal or
external microprocessor control.
The device incorporates a 388 x 295 pixel
image sensor and all the necessary support
circuits to generate composite video into a 75
load. Additional control signals support pixel
locked digitisation of the video signal.
A bi-directional serial interface and internal
register set allow full control and monitoring of
all camera functions. Automatic control of
exposure, gain and black level give a wide
range of operating conditions. All major control
functions are pin selectable giving maximum
flexibility with ease of use.
The VV5430 offers a complete camera system
ideally suited for integration into digital imaging
systems.
BLOCK DIAGRAM
VERTICAL
SHIFT
REGISTER
CKOUT
CKIN
SIN
CPE
FST
LST
PV
PVB
ODD
SDA
SCL
SAB0
SAB1
CLOCK
CIRCUIT
IMAGE
CAPTURE
SERIAL
I/F
PHOTO DIODE ARRAY
DIGITAL
CONTROL
LOGIC.
COLUMN SENSE AMPLIFIERS
SAMPLE & HOLD
ANALOG
VOLTAGE
REFS.
VIDEO
BUFFER
HORIZONTAL SHIFT REGISTER
VIDEO
AMP
AGC
AEC
RESETB
LIN
BKLIT
CCIR
VRT
Vbloom
VOFF
VBG
EBCK
EVWT
2V7
AVO
5V
Pixel Format
384 x 287 (CCIR)
320 x 243 (EIA)
Pixel Size
12µm x 12µm
Array Size
4.66mm x 3.54mm
Min. illumination 0.5 lux (Standard Clock)
S/N Typically 52dB
Exposure control Automatic (to 146000:1)
Gain Control
Up to +20dB
Power Supply
5v ±5%
Power
Temperature
< 300 mW
0oC - 40oC
cd27033c.fm
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VV5430 pdf, ピン配列
Specifications
SPECIFICATIONS
Package Details
0.51
TYP
1.56 TYP
0.55
0.53
13.7
Glass Lid
Die
Base
0.5 0.86
Viewed from side
The optical array is centred within the
package to a tolerance of ± 0.2 mm, and
rotated no more than ± 0.5o
Tolerances on package dimensions ±10%
2.16 Glass lid placement is controlled so that no
PIN 1 package overhang exists.
1.016 PITCH TYP
Viewed from below
All dimensions in millimetres
Spectral Response
1.0
0.8
0.6
0.4
0.2
0
Absolute Maximum Ratings
Wavelength nm
Parameter
Value
Supply Voltage
-0.5 to +7.0 volts
Voltage on other input pins
Temperature under bias
Storage Temperature
-0.5 to VDD + 0.5 volts
-15oC to 85oC
-30oC to 125oC
Maximum DC TTL output Current Magnitude 10mA (per o/p, one at a time, 1sec. duration)
Note: Stresses exceeding the Absolute Maximum Ratings may induce failure. Exposure to absolute
maximum ratings for extended periods may reduce reliability. Functionality at or above these
conditions is not implied.
09/04/97
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VV5430 電子部品, 半導体
VISION V V 5430 Sensor
Blemish Specification
A Blemish is an area of pixels that produces output significantly different from its surrounding
pixels for the same illumination level. The definition of a Blemish Pixel varies according to testing
conditions as follows:
Test
1 - Black Frame
2 - Dark Current
3 - Pixel Variation
Exposure
Minimum
Maximum
Mid range
Illumination
Blemish Pixel output definition
Black
Black
66% Sat.
Differing more than ± 100 mV. from modal
value.
Output more than three times the modal value
(see Dark Current Signal above).
Differing more than ±35mV from modal value.
Note: The mode of pixel values must be within
±70 mV of 66% of Vsat for all devices.
Note: Gain is set to Minimum and Correction set to Linear for all tests; measurement of blemishes for
Test 3 is conducted under standard illumination (see above), set to produce average output of
66% saturation level.
The pixel area of the sensor is divided into the following areas to qualify the blemish specification:
Area A is the central area of the array as defined
by the box with sides 50% of the linear height
and 50% of the linear width of the array.
Area C is 10 vertical pixels by 10 horizontal pixels
around the edge of the array.
Area B is the remaining area of the array.
The blemish specification is then defined as follows:
Area A
Area B
Area C
Image Area Max. No. of Blemishes
Notes
Area A
0 This is the most critical image area
Area B
Area C
4
1
Any number
Unconnected single pixels
Of up to four connected pixels (2x2 max.)
Blemishes in this area are not significant, but the device
shall, however, have no row or column (>50% of row or
column) faults in any area.
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部品番号部品説明メーカ
VV5430

Integrated CMOS Image Sensor with support for ADC and external control via serial interface

ETC
ETC


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