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74ABT08 の電気的特性と機能

74ABT08のメーカーはNXP Semiconductorsです、この部品の機能は「Quad 2-input AND gate」です。


製品の詳細 ( Datasheet PDF )

部品番号 74ABT08
部品説明 Quad 2-input AND gate
メーカ NXP Semiconductors
ロゴ NXP Semiconductors ロゴ 




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74ABT08 Datasheet, 74ABT08 PDF,ピン配置, 機能
74ABT08
Quad 2-input AND gate
Rev. 3 — 20 November 2015
Product data sheet
1. General description
The 74ABT08 high-performance BiCMOS device combines low static and dynamic power
dissipation with high speed and high output drive.
The 74ABT08 is a quad 2-input AND gate.
2. Features and benefits
Latch-up protection exceeds 500 mA per JESD78B class II level A
ESD protection:
HBM JESD22-A114F exceeds 2000 V
MM JESD22-A115-A exceeds 200 V
Multiple package options
Specified from 40 C to +85 C
3. Ordering information
Table 1. Ordering information
Type number Package
Temperature range Name
74ABT08D
40 C to +85 C SO14
74ABT08DB 40 C to +85 C SSOP14
74ABT08PW 40 C to +85 C TSSOP14
Description
plastic small outline package; 14 leads; body width
3.9 mm
plastic shrink small outline package; 14 leads; body
width 5.3 mm
plastic thin shrink small outline package; 14 leads;
body width 4.4 mm
Version
SOT108-1
SOT337-1
SOT402-1

1 Page





74ABT08 pdf, ピン配列
NXP Semiconductors
74ABT08
Quad 2-input AND gate
5.2 Pin description
Table 2.
Symbol
1A to 4A
1B to 4B
1Y to 4Y
GND
VCC
Pin description
Pin
1, 4, 9, 12
2, 5, 10, 13
3, 6, 8, 11
7
14
6. Functional description
Description
data input
data input
data output
ground (0 V)
supply voltage
Table 3.
Input
nA
L
X
H
Function table[1]
nB
X
L
H
[1] H = HIGH voltage level; L = LOW voltage level; X = don’t care.
7. Limiting values
Output
nY
L
L
H
Table 4. Limiting values
In accordance with the Absolute Maximum Rating System (IEC 60134).
Symbol Parameter
Conditions
VCC supply voltage
VI input voltage
VO output voltage
output HIGH or LOW
IIK
input clamping current
VI < 0 V
IOK
output clamping current
VO < 0 V
IO output current
output in LOW-state
Tj junction temperature
Tstg storage temperature
Min
0.5
[1] 1.2
[1] 0.5
18
50
-
[2] -
65
Max
+7.0
+7.0
+5.5
-
-
40
150
+150
Unit
V
V
V
mA
mA
mA
C
C
[1] The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
[2] The performance capability of a high-performance integrated circuit in conjunction with its thermal environment can create junction
temperatures which are detrimental to reliability. The maximum junction temperature of this integrated circuit should not exceed 150 C.
74ABT08
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 3 — 20 November 2015
© NXP Semiconductors N.V. 2015. All rights reserved.
3 of 13


3Pages


74ABT08 電子部品, 半導体
NXP Semiconductors
74ABT08
Quad 2-input AND gate
9,
QHJDWLYH
SXOVH

9
9,
SRVLWLYH
SXOVH
9

90

WI
WU

90
W:

90

WU
WI

90

W:
DDL
9,
*
9&&
'87
57
a. Input pulse definition
b. Test circuit
Fig 7.
Test data is given in Table 8.
RL = Load resistance.
CL = Load capacitance including jig and probe capacitance.
RT = Termination resistance should be equal to output impedance Zo of the pulse generator.
VEXT = External voltage for measuring switching times.
Test circuit for measuring switching times
92
9(;7
5/
&/ 5/
PQD
Table 8.
Input
VI
3.0 V
Test data
fi
1 MHz
tW
500 ns
tr, tf
2.5 ns
Load
CL
50 pF
RL
500
VEXT
tPHL, tPLH
open
74ABT08
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 3 — 20 November 2015
© NXP Semiconductors N.V. 2015. All rights reserved.
6 of 13

6 Page



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